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为了检验传输过程中数据的可靠性,设计了容错可逆的汉明码电路.提出了一种新型的可逆逻辑门(FVG),并且完成了FVG门等价的量子实现.利用FVG门和现有的容错可逆门,实现了汉明码编码电路和检测电路.以(7,4)汉明码设计为实例,根据量子代价和延迟对其进行性能评估,结果证明该电路比现有电路的性能提高10%~20%,仿真实验结果显示,电路逻辑结构正确,性能可靠.

参考文献

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