模拟了难溶盐对纳滤膜的污染过程并对其进行了介电谱解析,探讨了介电谱作为一种监测膜内部或表面污染层信息的方法之可行性.测量了NF90、NF270、NF-3种商用纳滤膜分别被4种难溶盐(CaCO3、CaSO4、BaSO4、SrSO4)污染前后膜/液体系的介电谱,介电谱的差异是来自于因膜孔径的不同而分别在膜孔内和膜表面形成的结垢层；解释了不同膜体系的介电弛豫机制:污染初期是由污染膜和水之间的界面极化和膜表面浓差极化共同决定,而4h之后主要受界面极化所控制；分析了介电参数随污染时间的变化,发现膜孔径大小以及难溶盐的结晶机制均会对膜污染过程产生影响.进一步,以CaSO4污染纳滤膜为例,利用引入了描述污染了的膜相的常相位角元件(CPE)的等价回路模型,对介电谱进行了理论解析.
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