采用纳米压人技术测试薄膜(涂层)的力学性能日益受到关注.测试过程中可自动记录载荷一压深曲线,能够获取薄膜(涂层)的硬度、弹性模量、薄膜(涂层)自身结合强度、膜基界面结合强度、残留应力、屈服强度以及应变硬化率等力学性能数据.本文扼要介绍了纳米压人技术表征薄膜(涂层)力学性能的测试原理.
参考文献
[1] | TazakiM;Nishibori M;Kinosita K .Ultra-microhardness of vacuum-deposited films:Ⅱ results for silver,gold,copper,MgF2,LiF and ZnS[J].THIN SOLID FILMS,1978,51:13-21. |
[2] | PethicaJB;Hutchings R;Oliver W C .Hardness measurement at penetration depths as small as 20 nm[J].Philosophical Magazine,1983,A48:593-606. |
[3] | RandallNX;Christoph R;Droz S;Julia-Schmutz C .Localized micro-hardness measurements with a combined scanning force microscope/nanoindentation System[J].Thin Solid Films,1996,290-291:348-354. |
[4] | OliverWC;Pharr G M.Improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments[J].Journal of Materials Research,1992(07):1564-1583. |
[5] | JonssonB;Hogmark S .Hardness measurements of thin films[J].Thin Solid Films,1984,114:257-269. |
[6] | BurnettPJ;Rickerby D S .The mechanical properties of wear-resistant coatings I:modeling of hardness behavior[J].Thin Solid Films,1987,148:41-50. |
[7] | BurnettPJ;Rickerby D S .The mechanical properties of wear-resistant coatings Ⅱ:experimental studies and interpretation of hardness[J].Thin Solid Films,1987,148:51-65. |
[8] | KralER;Komvopoulos K;Bogy D B .Elastic-plastic finite element analysis of repeated indentation of a half-space by a rigid sphere[J].Journal of Applied Mechanics,Transactions ASME,1993,60:829-841. |
[9] | WhiteheadAJ;Page T F .Nanoindentation studies of thin film coated systems[J].THIN SOLID FILMS,1992,220:277-283. |
[10] | X. Li;B. Bhushan .Measurement of fracture toughness of ultra-thin amorphous carbon films[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,1998(1/2):214-221. |
[11] | Jianning Ding;Yonggang Meng;Shizhu Wen .Mechanical properties and fracture toughness of multilayer hard coatings using nanoindentation[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,2000(1/2):178-182. |
[12] | Xiaodong Li;Bharat Bhushan .Micro/nanomechanical characterization of ceramic films for microdevices[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,1999(12):210-217. |
[13] | Haanappel VAC.;Metselaar HSC.;Vancorbach HD.;Fransen T.;Gellings PJ.;Vandervendel D. .THE MECHANICAL PROPERTIES OF THIN ALUMINA FILMS DEPOSITED BY METAL-ORGANIC CHEMICAL VAPOUR DEPOSITION[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,1995(1/2):153-163. |
[14] | CHIANGSS;Marshall D B;Evans A G;Parks J and Evans A G.A simple method for adhesion measurements .In:Surfaces and interfaces in ceramic and ceramic-metal systems[M].New York:Plenum Press,1981:603-617. |
[15] | D.F.Bahr;J.W.hoehn;N.R.Moody .Adhesion and acoustic emission analysis of failures in nitride films with a metal interlayer[J].Acta materialia,1997(12):5163-5175. |
[16] | M.D.Kriese;N.R.Moody;W.W.Gerberich .Effects of annealing and interlayers on the adhesion energy of copper thin films To SiO_2/Si substrates[J].Acta materialia,1998(18):6623-6630. |
[17] | J. M. SANCHEZ;S. EL-MANSY;B. SUN .CROSS-SECTIONAL NANOINDENTATION: A NEW TECHNIQUE FOR THIN FILM INTERFACIAL ADHESION CHARACTERIZATION[J].Acta materialia,1999(17):4405-4413. |
[18] | SURESHS;Giannakopoulos A E .A new method for estimating residual stresses by instrumented sharp indentation[J].Acta Materialia,1998,46:5755-5767. |
[19] | S.SURESH;A.E.GIANNAKOPOULOS;J.ALCALA .SPHERICAL INDENTATION OF COMPOSITIONALLY GRADED MATERIALS: THEORY AND EXPERIMENTS[J].Acta materialia,1997(4):1307-1321. |
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