利用透射电子显微镜、X射线衍射分析和穆斯堡尔谱分析技术研究了快凝Al-Fe-V-Si-Nd纳米晶薄带在疲劳过程中微结构变化,结果发现:固溶元素自α-Al晶内析出产生偏聚体,同时,X射线衍射谱出现一个额外的衍射峰.穆斯堡尔谱分析表明:X射线衍射谱中额外的衍射峰是由于疲劳过程中析出相(Al8Fe4Nd1相)出现了取向择尤现象.
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