根据在X射线二维衍射几何关系下建立的应力应变基本方程,提出了一种基于X射线多晶面探测器衍射系统的残余应力及其分布测量方法,即通过分析X射线衍射圆锥的变形程度确定应变张量,进而计算应力张量.该方法有效地利用X射线面探测器的"虚拟摆动"功能,在一定程度上解决了传统X射线衍射法较难处理的粗晶材料和有织构材料的残余应力测量问题.对304不锈钢的残余应力及其分布进行了分析与计算,结果表明,该合金呈表面残余压应力,并且应力分布比较均匀.
参考文献
| [1] | 张定铨;何家文.材料中残余应力的X射线衍射分析和作用[M].西安:西安交通大学出版社,1999 |
| [2] | Noyan I C;Cohen J B.Residual Stress:Measurements by diffraction and Interpretation[M].New York:Springer,1987 |
| [3] | He B B;Preckwinkel U;Smith K L .Fundamentals of two-dimensional X-ray diffraction[J].Advances in X-Ray Analysis,1999,43:429-438. |
| [4] | Bunge H J;Klein H .Determination of quantitative,high-resolution pole figures with the area detector[J].Zeitschrift fur Metallkunde,1996,87:465-475. |
| [5] | Leng Chen;Weimin Mao;Huiping Feng .Investigation of Online Texture Measurement in Steel Sheets Based on X-Ray Area Detector[J].Materials Science Forum,2002(Pt.1):227-232. |
| [6] | MAO Weimin,CHEN Leng,YANG Ping,FENG Huiping.Rapid texture measurement of annealed aluminum sheet based on X-ray diffraction[J].科学通报（英文版）,2004(19):2112-2114. |
| [7] | He B B Smith K L.A new method for residual stress measurement using an area detector[A].Linkoping,Sweeden,1997:634-639. |
| [8] | CHEN L;MAO W M;LU F X;YANG P .Residual stress analysis of microwave plasma CVD diamond films[J].Materials Science Forum,2005,495-497:1359-1364. |
| [9] | Bruker AXS.GADDS User's Manual[M].Medison:Bruker AXS Inc,USA,1999 |
| [10] | Bunge H J.Texture Analysis in Materials Science[M].London:Butterworth,1982 |
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