本文以均苯四甲酸二酐(PMDA)和4,4′-二氨基二苯醚(DAPE)作主要原料合成的聚酰亚胺(PI)为基体,以有机化蒙脱土(MMT)为无机相,制备了聚酰亚胺/MMT纳米复合薄膜。采用透射电镜(TEM)、X射线衍射(XRD)对薄膜徽相形态结构进行了分析测试,考察了薄膜的拉伸强度、电气性能和热性能。
Polyimide/Montmorillonite (PI/MMT)Nanocomposite film was prepared by using pyromellitic dianhydride (PMDA) and 4, 44′-diamino diphenyl ether (DAPE) as monomers,as well as organic montmorillonite (MMT) treated by 16 - decyltrimethyl ammonium chloride as inorganic reinforcement. We tested themechanical,thermal and electrical properties of the PI/MMT film made with the flushing shaping technique.The results show that the tensile strength of film increases up to 78% ,compared with the pure PI film,thereis no significant change in electrical property. Besides, the thermal property is improved by delaying thedegradation temperature of film.
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