本文报道了锡掺杂C60薄膜样品的扫描电镜,X射线衍射,紫外可见吸收光谱和电阻随温特性的测量结果;显示样品由纳米级颗粒组成,为面心立方结构,掺杂锡原子在禁带中形成施主能级,电阻随温度增加呈指数衰减,霍耳效应证实为N型半导体.
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