本文对低辐射镀膜层的理论光学特性的计算机辅助模拟(CAS)进行了探讨.研究表明,在可见光和红外区范围内进行的低辐射镀膜层光学测量显示了计算机辅助模拟理论计算与实验结果存在较好的对应关系.
参考文献
[1] | C Shacefer;G.Brauer;J.Szczybowski .Low emissivity coatings on architectural glass[J].Surface and Coatings Technology,1997,93:37-45. |
[2] | B.Karlsson;E.Valkonen;T.Karlsson;C.G.Ribbing .[J].THIN SOLID FILMS,1981,86:91. |
[3] | E Valkonen;B Karsson;C G Ribbing .[J].太阳能,1984,32(02):211. |
[4] | E Kusano;J J Kawaguchi;K Enjougi .[J].Journal of Vacuum Science and Technology A-Vacuum Surfaces and Films,1986,A4(06):2907. |
[5] | C A Bishop;R P Howson .[J].Solar Energy Materials and Solar Cells,1986,13:175. |
[6] | S J Nadel .[J].Journal of Vacuum Science and Technology A-Vacuum Surfaces and Films,1986,a5:2709. |
[7] | J.Wolfe.[A].,1995 |
[8] | M Miyazaki;E Ando .[J].Journal of Non-Crystalline Solids,1994,178:245. |
[9] | R M Smith.Semiconductors[M].Cambridge:Cambridge University Press,1961 |
[10] | Wu Hao.Fabrication and Characterization of Magnetro Sputtered NanoStructured Ag Films[J].真空电子技术,1999 |
上一张
下一张
上一张
下一张
计量
- 下载量()
- 访问量()
文章评分
- 您的评分:
-
10%
-
20%
-
30%
-
40%
-
50%