以醋酸镍为原料,用溶胶-凝胶法在石英衬底上制备了氧化镍薄膜,并利用X射线衍射、紫外-可见吸收谱对样品进行了表征.结果表明,当热处理温度低于800℃时,随着温度升高,石英衬底上生长的氧化镍薄膜的晶粒逐渐长大,其(200)面对应的衍射峰的强度增加,取向度提高.当热处理温度超过800℃后,晶粒尺寸不但不再增加,反而略有下降,同时,取向度也略有下降.因此就晶粒大小及取向度而言,最佳热处理温度为800℃,此时薄膜的晶粒尺寸最大,(200)取向度最高.紫外-可见吸收谱分析表明,氧化镍薄膜的禁带宽度也随着处理温度的变化而变化,其变化趋势与晶粒尺寸的变化正好相反,即禁带宽度在热处理温度为800℃时有极小值.纳米尺寸粒子中存在的量子约束效应可以说明这一变化趋势.
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