重点研究了聚焦离子束的相关原理和应用。利用聚焦离子束应力引入致形变( Focused Ion Beam Stress-Introduced De-formation, FIB-SID)技术与常规微加工工艺相结合,制备微型金属无源螺旋电感的设计方法和工艺流程,并对其电学性能进行初步高频测试。首先在SOI( Silicon-on-Insulator)基片上通过光刻、溅射以及各项同性刻蚀等常规工艺制得悬浮的金属悬臂梁,再利用FIB刻蚀原理进行应力引入,通过控制注入离子剂量、 FIB应力引入的次数、 FIB扫描的间距等试验参数制得不同尺寸结构的三维螺旋金属无源电感。最后,采用安捷伦网络分析仪与微波探针台,使用GSG结构及相应的去嵌方法,对微型金属螺线管电感进行了高频测试。得出了三维螺旋微纳电感的电感值、品质因子、电压驻波比、回波损耗随频率变化关系。
The combination of Focused Ion Beam Stress-introduced Deformation ( FIB-SID) and micro-fabrication tech-nology is focused on, and the fabrication process and test methods of metal passive micro-helix inductor are described. First of all, the suspended metal cantilever is made on SOI(Silicon-on-insulator) by photolithography, sputtering and iso-tropic etching.Then, the stress is introduced to fabricate 3D metal passive micro-helix inductor with different sizes by con-trolling ion dose, FIB stress introduced time, FIB scanning pitch.Finally, the metal passive micro-helix inductor is tested at high frequency with the help of Agilent network analyzers and microwave probe station using GSG test structure and de-embedding process.The relationship between the Inductance value, quality factor, voltage standing wave ratio、 return loss of micro-helix inductors against frequency is obtained.
参考文献
[1] | Atsuhito S;Tadao I .Growth of Diamond Thin Films by Elec-tron Assisted Chemical Vapor Deposition[J].Applied Physics Letters,1985,46(02):146-147. |
[2] | John M .Focused Ion Beam Technology and Applications[J].Journal of Vacuum Science & Technology B:Microelectronics and Nanometer Structures,1987,5(02):469-495. |
[3] | Xia L;Wu W G;Xu J et al.3D Nanohe-Lix Fabrication and 3D Nanometer Assembly by Focused Ion Beam Stress-Introducing Technique[R].Istanbul:Turkey,MEMS,2006. |
[4] | Lai X H;Ding F;Xu Z G et al.Suspended Nanoscale Solenoid Metal Inductor with Tens-Nh Level Inductance[R].Tucson:AZ,MEMS,2008. |
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