通过对磁感生应变和磁增强相变应变的测量, 研究了Ni50.5Mn26.5Ga23单晶磁感生应变的温度依赖性和磁控形状记忆效应. 结果表明, 随着温度的降低; Ni50.5Mn26.5Ga23单晶的饱和磁感生应变量先是迅速减小, 然后缓慢减小; 磁场的方向不同, 随着温度降低饱和磁感生应变量减小的速度也不 同. 根据合金形状记忆的特点和马氏体变体择优取向的机理, 对实验结果进行了分析和讨论.
By measuring the magnetic--field--induced strain (MFIS) and the transformation strain with a field bias applied in different direction, the temperature dependence of MFIS and the field--controlled shape memory effect in the Ni50.5Mn26.5Ga23 single crystal were investigated. It was found that with decreasing temperature at the martensite phase, the saturated MFIS first decreases rapidly and then the decreasing rate becomes smaller and smaller, reflecting the temperature dependence of the MFIS in the Ni$_{2}$MnGa system. Moreover, it was also found that the decreasing rate of the saturated MFIS with decreasing temperature is different with a pulse field applied in different direction. The results are discussed with reference to the shape memory characteristics of the alloy and the mechanism of the preferentially orientation of martensitic variants.
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