本文针对ＸＰＳ（Ｘ射线光电子能谱）数据处理中线型选择的问题作出了一个新改进，在曲线拟合过程中应用了一个卷积线型。新算法被称为＂组合算法＂对Ｃｕ标样３ｐ谱和Ｆｅ－Ｍｎ－Ａｌ合金钝化膜Ｏｌｓ谱的拟合表明，它比选择Ｇａｕｓｓ－Ｌｏｒｅｎｔｚ积函数（ＧＬＰ）或Ｇａｕｓｓ－Ｌｏｒｅｎｔｚ和函数（ＧＬＳ）更为准确和有效
A new line shape was chosen for curve fitting of XPS (X-ray photoelectron spectroscopy) data. In general. the GLP(Gauss-Lorentz product function) orGLS(Gauss-Lorentz sum function) was used as the line shape of XPS, but they are not strict because the true line shape is a convolution of many comments. A convoluted line shape is chosen in fitting procedure. The new algorithm is called ‘combination algorithm' . A detec tion was taken with Cu 3p spectrum and O ls spectra of Fe-Mn-Al alloy. It is shown that the combination algorithm is more effective for the process of XPS data than GLP and GLS.(Correspondent: GONG Yandong, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110015)
参考文献
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| [3] | SherwoodPMA．PracticalSurfaceAnalysis,2nded．,Chechester:JohnWileyandSons,1990 |
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