以SiCl4-H2为气源,用等离子体化学气相沉积技术,在衬底温度仅为200℃时能获得多晶硅薄膜.最大晶粒达1.5μm,结晶度在90%以上.薄膜中不合Cl、H、C、N、O等杂质,暗电导率高达10-4Ω-1@cm-1,光照稳定性好.对氯元素在低温成膜中的作用进行初步讨论.
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