GaSb是Ⅲ-Ⅴ族系列直接带隙半导体材料,其内部的缺陷性质对调控材料的热电性能具有重要作用.研究发现,在GaSb中掺杂Pb后材料内部产生了大量的反结构受主缺陷Pbsb-及施主缺陷PbCa+,但本征缺陷VGa3-和SbGa2+浓度减少.这些缺陷浓度的变化直接调控了材料的热电输运性能.例如,掺杂0.25％ Pb后,室温载流子浓度由未掺杂时的～5.04 ×1023m-3突增到9.50×1025 m-3;在867 K时,电导率由0.56×104 Ω-1·m-1增加到4.82×104 Ω-1·m-1;晶格热导率由4.63 W· K-1·m-1下降到3.41 W· K-1·m-1.最大热电优值(ZT)为0.21,约是未掺杂GaSb最大ZT值的10倍.
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