采用一步蒸发法分别在钠钙硅玻璃基底、Mo基底上制备Cu(In,Ga) Se2(CIGS)薄膜,通过改变基底温度研究了玻璃和钼基底下CIGS薄膜晶体结构随温度变化情况,采用XRD、SEM、XRF及UV-vis对CIGS薄膜组成、结构及性能进行了表征.结果表明:在玻璃和Mo基底下制备的CIGS薄膜具有均匀一致的化学计量比组成,不同基底温度下,薄膜呈片状和柱状两种结构,片状结构的光吸收系数和禁带宽度高于柱状结构的光吸收系数和禁带宽度.
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