采用射频磁控溅射方法在玻璃和硅衬底上制备出Al掺杂ZnO(AZO)薄膜.利用X射线衍射(XRD)、扫描电子显微镜(SEM)和光致荧光发光(PL)等系统研究了不同Al掺杂量对ZnO薄膜的结晶性能、表面形貌和光学特性等的影响.结果显示,硅衬底和玻璃衬底均出现了(100)和(002)衍射峰,玻璃的(002)衍射峰强于硅.同时随着退火时间的延长,(002)峰强度基本不变,(100)峰的强度逐渐增强,薄膜呈(100)取向生长,表明退火时间可能会引起晶体生长过程中择优取向的改变.退火1.5h样品可以得到最佳的(002)取向.随着退火时间的延长,样品的PL谱中各发光峰强度先增强后减弱随后又增强,且蓝光双峰强度大于绿光峰强度;位于443nm的蓝光发光峰发生了蓝移.
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