基于X射线应力测量原理, 建立了一种双相材料相间内应力的测量与表征方法. 利用衍射谱线上两相的衍射峰位差, 有效地消除了仪器的系统误差. 测量了实 际材料SiCp/6061Al中的相间内应力, 证实该方法具有较高的测量精度.
Based on the theory of X--ray stress measurement, a method of measurement and representation for the inter--phase stress of double--phase material was established. The systematic error of the instrument has been effectively reduced by the difference between diffraction angles of two phases. The inter--phase stress of an actual material (SiCp/6061Al composites) was measured, and it was verified that this method has a high measuring precision.
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