欢迎登录材料期刊网

材料期刊网

高级检索

氢化非晶硅(a-Si:H)是一种重要的光敏感薄膜材料,其稳定性的好坏是决定能否应用于器件的重要因素之一.介绍了a-Si:H薄膜稳定性的研究进展,论述了a-Si:H薄膜的稳定性与Si-Si弱键的关系,分析了先致衰退效应(S-W效应)产生的几种机理,提出了在薄膜制备和后处理过程中消除或减少Si-Si弱键以提高a-Si:H薄膜稳定性的方法.

参考文献

[1] Tissot J L;Rothan F;Vedel C et al.LETI/LIR'S uncooled microbolometer development[J].Proceedings of the SPIE,1988,3379:139.
[2] 清水立生,严辉.非晶半导体的研究与应用[J].功能材料,2001(04):348-352.
[3] Steabler D L;Wronski C R .Reversible conductivity changes in discharge-produced amorphous silicoa[J].Applied Physics Letters,1977,31:292.
[4] Stutzmann M;Jackson W B;Tsai C C .Light-induced metastable defects in hydrogenated amorphous silicon;A systematic study[J].Physical Review B:Condensed Matter,1985,32:23.
[5] Street R A;Winer K .Defect equilibria in undoped a-Si:H[J].Physical Review B:Condensed Matter,1989,40:6236.
[6] Branz H .Hydrogen collision model of light-induced metastability in hydrogenated amorphous silicoa[J].Solite State Comanications,1998,105:387.
[7] Sriraman S;Agarwal S;Aydil E S et al.Mechanism of hydrogen-induced crystallization of amorphous silicoa[J].Nature,2002,418(6893):62.
[8] Powell M J;Dean S C .Improved defect-pool model for charged defects in amorphous silicoa[J].Physical Review B:Condensed Matter,1993,48:10815.
[9] Adler D .Origin of the photo-induced changes in hydrogenated amorphous silicoa[J].Solar Cells,1983,9:133.
[10] Ishii N;Kumeda M;Shimizu T .A model for the StaeblerWronski effect based on charged impurities[J].Japanese Journal of Applied Physics,1985,24:L244.
[11] Redfield D;Bube R H .Identification of defects in amorphous silicoa[J].Physical Review Letters,1990,65:464.
[12] Shimizu S.;Okawa K.;Azuma M.;Kamiya T.;Fortmann CM. Shimizu I.;Komaru T. .Properties of amorphous silicon solar cells fabricated from SiH2Cl2[J].Solar Energy Materials and Solar Cells: An International Journal Devoted to Photovoltaic, Photothermal, and Photochemical Solar Energy Conversion,2001(1/4):289-295.
[13] Uesugi T;Ihara H;Matsumura H.Steabler-Wronski effect in hydro-fluorinated amorphous silicon prepared using the intermediate species SiFz[J].Japanese Journal of Applied Physics Part l-Regular Papers Short Notes and Review Papers,1985:24-909.
[14] Schmid U;Seidel H .Enhanced stability of Ti/Pt micro-heaters using a-SiC : H passivation layers[J].Sensors and Actuators, A. Physical,2006(0):194-201.
[15] Mokeddem K;Aoucher M;Smail T .Hydrogenated amorphous silicon nitride deposited by DC magnetron sputtering[J].Superlattices and microstructures,2006(4/6):598-602.
[16] 张慧芳,吴召平.a-Si:H薄膜光衰效应的研究[J].山东工业大学学报,2001(05):428-432.
[17] Su T;Taylor P C;Ganguly G et al.Direct role of hydrogen in the staebler-wronski effect in hydrogenated amorphous silicoa[J].Physical Review Letters,2002,89:015502.
[18] Tissot J L et al.320X240 microbolimeter uncooled IRFPA development[J].Proc of SPIE,2000,413:473.
[19] Myong S Y;Kwon S W;Lim K S et al.Inclusion of nanosized silicon grains in hydrogenated protocrystalline silicon multilayers and its relation to stability[J].Applied Physics Letters,2006,88(083118):1.
[20] Ambrosone G;Coscia U;Murri R.Structural,optical and electrical characterizations of fzc-Si:H films deposited by PECVD[J].Solar Energy & Solar Cells,2005:87-375.
[21] Laia M Z et al.Thermal effects on LPCVD amorphous silicoa[J].Thin Solid Films,2006,504:145.
[22] Parka J H;Kima D Y;KyungKoa J et al.High temperature crystallized poly-Si on Mo substrates for TFT application[J].Thin Solid Films,2003,427:303.
[23] Rao R;Sun G C .Microwave annealing enhances Al-induced lateral crystallization of amorphous silicon thin films[J].Journal of Crystal Growth,2004,273:68.
[24] Popova L;Peneva S;Aleksandrova P;Beshkov G .Structural investigations of RTA boron-doped thin a-Si layers[J].Journal of Materials Science. Materials in Electronics,2005(8):489-493.
[25] Saleh R;Nickel NH;Maydell KV .Laser crystallization of compensated hydrogenated amorphous silicon thin films[J].Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites,2006(9/20):1003-1007.
[26] Cosciaa U;Ambrosonea G;Minarinib C et al.Structural modification of laser annealed a-Si1-x-Cx:H films[J].Applied Surface Science,2006,252:4493.
[27] Aoki T;Kanno H;Kenjo A;Sadoh T;Miyao M .Au-induced lateral crystallization of a-Si1-xGex (x : 0-1) at low temperature[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,2006(1/2):44-47.
[28] Wang Y.Z.;Awadelkarim O.O. .Metal-induced solid-phase crystallization of hydrogenated amorphous silicon:dependence on metal type and annealing temperature[J].Applied physics, A. Materials science & processing,2000(5):587-590.
[29] Park SJ;Kim KH;Jang J .Control of grain position in Ni-mediated crystallization of amorphous silicon[J].Journal of Crystal Growth,2006(2):382-386.
[30] Rojas-Lopez M;Orduna-Diaz A;Delgado-Macuil R;Gayou VL;Perez-Blanco RE;Torres-Jacome A;Olvera-Hernandez J .Morphological transformation and kinetic analysis in the aluminum-mediated a-Si : H crystallization[J].Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites,2006(3):281-284.
[31] Wang NL;Dalal VL .Improving stability of amorphous silicon using chemical annealing with helium[J].Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites,2006(9/20):1937-1940.
[32] Rui Yunjun;Mei Jiaxin;Xu Jun et al.Structural ordering in amorphous silicon thin film due to post hydrogen plasma annealing[J].Proc of SPIE,2004,5774:279.
[33] Branz H M;Boulder C O .Method for improving the stability of amorphous silicon[P].US 713400B1,2004-03-30.
[34] Branz H M;Xu Y Q;Heck S et al.Improved stability of hydrogenated amorphous silicon photosensitivity by ultraviolet illumination[J].Applied Physics Letters,2002,81:3353.
[35] Zhang M.;Nakayama Y.;Pan L. .Structural modifications of hydrogenated amorphous carbon nitride due to ultraviolet light irradiation and thermal annealing[J].Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites,2000(Pt.B):815-820.
[36] Bronner W.;Mehring M.;Bruggemann R. .Transport and electrically detected electron spin resonance of microcrystalline silicon before and after electron irradiation - art. no. 165212[J].Physical Review.B.Condensed Matter,2002(16):5212-0.
[37] Klaver A;Metselaar J W;Zeman M.Simulations on 1-Mev electron-beam irradiated amorphous silicon solar cells with varying thickness[A].Florida,USA,2005:1440.
上一张 下一张
上一张 下一张
计量
  • 下载量()
  • 访问量()
文章评分
  • 您的评分:
  • 1
    0%
  • 2
    0%
  • 3
    0%
  • 4
    0%
  • 5
    0%