材料期刊网

Phase relationships at ambient temperature in the pseudobinary system Pr5Si4-Pr5Ge4 were studied by X-ray powder diffraction (XRD). Three structurally distinct phase regions exist in this system. The Pr5Si4-based solid solution where Ge statistically substitutes for Si crystallizes in the Zr5Si4-type tetragonal structure with space group P4(1)2(1)2. The Pr5Ge4-based solid solution where Si statistically substitutes for Ge crystallizes in Sm5Ge4-type orthorhombic structure with space group Pnma. The crystal structure of a ternary intermediate phase, which exists between 1.65 less than or equal to x less than or equal to 2.6, is determined for the first time, and shown to be the Gd5Si2Ge2-type monoclinic structure with space group P112(1)/a. The Rietveld powder diffraction profile fitting technique was used for the refinement of crystal structure. The lattice parameters, atomic occupations, interatomic distances of the Pr5Si4, Pr5Ge4 and Pr5Si2Ge2 compounds were derived. (C) 2002 Elsevier Science B.V. All rights reserved.