在SmCo/Cr薄膜中,Cr底层的取向结构对薄膜的磁学性能有很大的影响.设计了4因素3水平的正交实验L9(34),并通过数理统计的方法分析了Cr底层的溅射参数对SmCo/Cr薄膜矫顽力的影响.用较少的实验得到Cr底层的最佳实验条件:靶基距为4 cm,功率为50 W,溅射气压为0.5 Pa,溅射时间为9 min.并发现了靶基距、功率和溅射气压对薄膜矫顽力的影响较大,其中靶基距是薄膜矫顽力最主要的控制因素.而溅射时间在所取的水平上对薄膜矫顽力的影响最小.本实验设计可达到95%的置信度.
参考文献
[1] | Twisseimann D J;Chambers P G;Ross C A et al.[J].Journal of Applied Physics,2002,92:3223-3225. |
[2] | Min T;Zhu J G .[J].Journal of Applied Physics,1994,75:6129-6131. |
[3] | Velu E M T;Lambeth D N .[J].Journal of Applied Physics,1991,69:5157-5159. |
[4] | Velu E M T;Lambeth D N;Thomton J T et al.[J].Journal of Applied Physics,1994,75:6172-6174. |
[5] | Okumura Y.;Morita H.;Yang XB.;Fujimori H.;Suzuki O. .MICROSTRUCTURE AND MAGNETIC PROPERTIES OF SPUTTERED COSM/CR THIN FILMS WITH HIGH COERCIVITIES[J].Journal of Magnetism and Magnetic Materials,1995(1/2):5-12. |
[6] | Laughlin D.E.;Wong B.Y. .The crystallography and texture of Co-based thin film deposited on Cr underlayers[J].IEEE Transactions on Magnetics,1991(6):4713-4717. |
[7] | 王亦忠,张茂才,乔档,韩宝善,张臻蓉,梁冰青,王荫君,沈保根.各向同性富铁Fe-Pt纳米晶薄膜的形成及其磁性[J].稀有金属材料与工程,2002(03):213-216. |
[8] | Takei S.;Morisako A.;Matsumoto M.;Haeiwa T.;Shomura S. .SMCO/CR BILAYER FILMS FOR HIGH-DENSITY RECORDING MEDIA[J].Journal of Applied Physics,1997(8 Pt.2a):4674-4676. |
[9] | Feng Y C;Laughlin D E;Lambeth D N .[J].Journal of Applied Physics,1994,76:7311-7313. |
[10] | 周晓钟.概率论及数理统计[M].Harbin: The People's Press of Heilongjiang,1995:32. |
[11] | 刘晓石;陈鸿建;何腊梅.概率论与数理统计[M].北京:科学出版社,2002:127-134. |
[12] | Akiyama M;Xu C N;Nonaka K et al.[J].Thin Solid Films,1998,315:62-65. |
[13] | Hickernell F.J.;Yue R.-X.;Hickernell F.S. .Statistical modeling for the optimal deposition of sputteredpiezoelectric films[J].IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control,1997(3):615-623. |
[14] | 许小红,武海顺,张富强,金志浩.氮化铝薄膜结构和表面粗糙度的研究[J].稀有金属材料与工程,2000(06):394-397. |
[15] | 许小红,武海顺,张富强,张聪杰,李佐宜.反应溅射制备AlN薄膜中沉积速率的研究[J].稀有金属材料与工程,2002(03):209-212. |
上一张
下一张
上一张
下一张
计量
- 下载量()
- 访问量()
文章评分
- 您的评分:
-
10%
-
20%
-
30%
-
40%
-
50%