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用射频-磁控共溅射技术制备出Ag体积分数分别为5%,10%,15%和20%的Ag-MgO复合团簇薄膜.用X-射线衍射仪、原子力显微镜和紫外-可见分光光度计研究了复合团簇薄膜的微结构、表面形貌和光学性质.结果表明:随着Ag体积分数从5%增大到20%,薄膜中Ag的平均晶粒尺寸由8.2 nm增大到10.9 nm,薄膜的平均颗粒尺寸从37.9 nm增大到43.4 nm,方均根(rms)粗糙度先减小后略有增大,可见光范围内的平均透过率先下降后几乎保持不变.

参考文献

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