TEM Investigations on Layered Ternary Ceramics

材料科学技术（英文）, 2007, 23(2): 145-165.

^1, , ^2, , ^3,

1.Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China;Graduate School of Chinese Academy of Sciences, Beijing 100039, China

2.Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China

3.Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China

基金项目: the National Outstanding Young Scientist Foundation(59925208) 国家自然科学基金(50232040;50302011;90403027)

TEM Investigations on Layered Ternary Ceramics

Keywords： Layered ternary ceramics

Layered ternary ceramics represent a new class of solids that combine the merits of both metals and ceramics.These unique properties are strongly related to their layered crystal structures and microstructures. The combination of atomic-resolution Z-contrast scanning transmission electron microscopy (STEM) and transmission electron microscopy (TEM), selected area electron diffraction (SAED), convergent beam electron diffraction (CBED) represents a powerful method to link microstructures of materials to macroscopic properties, allowing layered ternary ceramics to be investigated in an unprecedented detail. Vicrostructural information obtained using TEM is useful in understanding the formation mechanism, layered stacking characteristics, and defect structures for layered ternary ceramics down to atomic-scale level; and thus provides insight into understanding the "Processing-Structure-Property" relationship of layered ternary ceramics. Transmission electron microscopic characterizations of layered ternary ceramics in Ti-Si-C, Ti-Al-C, Cr-Al-C, Zr-Al-C, Ta-Al-C and Ti-Al-N systems are reviewed.

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TEM Investigations on Layered Ternary Ceramics

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