采用化学镀法制备了Co-P磁记录薄膜.当薄膜厚度为0.3μm时,矫顽力可达4.54×104A/m,剩余磁化强度为0.068T.X射线衍射分析表明,当Co-P薄膜较薄时,薄膜结构中无明显择优取向,晶粒较小,此时矫顽力较高;当厚度增加至3～4μm以上时,结构中择优取向明显,晶粒较大,此时薄膜的矫顽力较低.将其应用于磁旋转编码器的磁鼓记录介质,制成直径φ40mm的磁鼓,当原始充磁磁极对数为512时,脉冲计数完整,输出信号强,波形稳定.
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