采用中频非平衡磁控溅射工艺,在316L不锈钢、高速钢和硬质合金3种基体材料上制备Ti/TiN/Ti(C,N)膜系的硬质薄膜.通过改变工作气氛、基体负偏压等工艺参数,对制备薄膜的硬度进行检测分析,结果表明:在Ti(C,N)薄膜的制备中,工作气氛和基体负偏压是影响薄膜硬度的主要因素.当工作气体的通人比例C2H2/(N2+Ar)＜1/9时,薄膜硬度较高.当通入的乙炔(C2H2)流量增加时,会明显降低薄膜硬度.当基体负偏压在一定范围内增加时,薄膜硬度随之逐渐提高;当负偏压增加到200 V时,薄膜硬度最大;负偏压超过200 V,薄膜硬度明显下降.基体材料对薄膜硬度的影响较大,在不同基体材料上镀制同一种硬质薄膜时,薄膜硬度不同;3种基体材料上沉积薄膜的硬度数316L不锈钢基体上的薄膜硬度最低.
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