介绍了原子力显微镜(AFM)在高分子薄膜领域中的最新应用技术.在定位观察薄膜时,可采用碳纳米管定位法以及针尖打孔定位法对所观察的样品进行定位,该方法可实现对样品进行离位处理之后再次精确定位.在测量高分子薄膜厚度时,可采用针尖打孔法和漂膜法通过制备断面台阶利用AFM精确测量薄膜厚度.基于特殊相分离形貌的嵌段共聚物薄膜,可采用AFM针尖对其表面进行锻造纳米加工.这些技术拓展了AFM在聚合物薄膜表征以及纳米加工等领域的应用.
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