运用XRD、TEM、EDS等实验手段,研究了Si离子掺杂对PMS-PZT材料的相结构、微观结构以及电畴形貌的影响.XRD测试结果表明,所有材料都显示钙钛矿结构,四方度(c/a)随着掺杂量的增加而增大.TEM研究结果表明,随着Si离子掺杂量的增加,电畴的形貌由鱼刺型过渡到微米级的带状畴,最后转变为波浪状的电畴.EDS表明在材料的晶界处含有纳米级的SiO2和PbSiO3,并且发现单斜晶系的孪晶ZrO2在晶界附近析出.本文对孪晶ZrO2的析出及其析出量随着硅离子含量增加而增加的原因作了解释,最后对材料压电性能的降低进行了探讨.
The microstructure, phase properties and domain morphology of Si-doped PMS-PZT ceramics were
investigated by using X-ray diffraction (XRD), transmission electron microscope (TEM) and energy dispersive spectrometry (EDS). XRD results
indicate that all specimens show perovskite structure and tetragonal distortion (c/a) increases as the dopant content increases. TEM results
show that domain morphology evolves from the normal herringbone domain to micron-sized lenticular shape domain structure, and finally changes to
“wavy” pattern as SiO2 content changes from 0--1wt%. The nano-scale secondary phases of SiO2 and PbSiO3 were observed on the
grain boundary, and the twinned ZrO2 was found surrounded by PMS-PZT perovskite phase. The mechanism of the appearance of twinned ZrO2
and its content increase with the increase of Si concentration were discussed.
参考文献
| [1] | Gene H Haertling. J. Am. Ceram. Soc., 1999, 82: 797--818. [2] He Zeming, Ma J, Zhang Ruifang, et al. J. Eur. Ceram. Soc., 2003, 23: 1943--1947. [3] Yoon S J, Kang H W, Kucheiko S I, et al. J. Am. Ceram. Soc., 1998, 81: 2473--2476. [4] Long J W, Chen H Y, Meng Z Y. Mater. Sci. and Eng. B, 2003, 99: 445--448. [5] Moon J H, Jang H M, You B D. J. Mater. Res., 1993, 8: 3184--3191. [6] Yoon S J, Amod J, Uchino K J. J. Am. Ceram. Soc., 1997, 80: 1035--1039. [7] Zhu X H, Zhu J M, Zhou S H. J. Eur. Ceram. Soc., 2000, 20: 1251--1255. [8] Tan Q, Xu Z, Viehand D. J. Mater. Res., 1999, 14: 465--475. [9] He L X, Gao M, Li C E. J. Eur. Ceram. Soc., 2001, 21: 703--709. [10] Saha S K, Agrawal D C. Am. Ceram. Soc. Bull., 1992, 71: 1424--1428. [11] Wright J S, Francis L F. J. Mater. Res., 1993, 7: 1712--1720. |
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