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[1] E. Pihan;A. Focsa;A. Slaoui;C. Maurice .Crystallographic analysis of polysilicon films formed on foreign substrates by aluminium induced crystallisation and epitaxy[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,2006(7):15-20.
[2] E. Aubry;M.N. Ghazzal;V. Demange;N. Chaoui;D. Robert;A. Billard .Poisoning prevention of TiO2 photocatalyst coatings sputtered on soda-lime glass by intercalation of SiNx diffusion barriers[J].Surface & Coatings Technology,2007(18):7706-7712.
[3] A. Focsa;A. Slaoui;E. Pihan;F. Snijkers;P. Leempoel;G. Beaucarne;J. Poortmans .Poly-Si films prepared by rapid thermal CVD on boron and phosphorus silicate glass coated ceramic substrates[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,2006(7):404-410.
[4] H.Y. Wang;N. Usami;K. Fujiwara .Microstructures of Si multicrystals and their impact on minority carrier diffusion length[J].Acta materialia,2009(11):3268-3276.
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