本文开发了半导体融体的热扩散率的测量装置.通过引入石英玻璃试样容器将激光闪光法扩展到适合于融体试样.首先在实验及理论上研究了石英玻璃层对试样的热辐射及温度相应的影响,结果发现在室温以上温度范围,石英玻璃层的存在只减小红外辐射探测器的信号幅度但不改变时间变化历程.由闪光法的原理,包含石英玻璃层的复合试样则可以作为单层试样处理.根据这一原理,我们首次对三元红外半导体融体Ini-xGaxSb在不同组分时,温度范围800 K至1200 K的热扩散率进行了测量.
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