研究了原位加热溅射的NiTi形状记忆合金薄膜的结构,讨论了制备工艺及织构对薄膜相变特征的影响,采用电阻法及X射线衍射分析了薄膜的结构及相变过程,确定了最适合于微器件的溅射工艺.结果发现:溅射时采用原位加热可直接获得具有织构的晶化薄膜,提高溅射功率将使薄膜的相变温度升高.
参考文献
[1] | Isalgue;Torra V .[J].Materials Science and Engineering,1999,A273-275:717. |
[2] | Ken K Ho;Mohanchandra K P;Gregory P Carman .[J].Thin Solid Films,2002,413:1. |
[3] | Ken K. Ho;Gregory P. Carman .Sputter deposition of NiTi thin film shape memory alloy using a heated target[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,2000(1/2):18-29. |
[4] | Miyazaki S;Ishida A .[J].Materials Science and Engineering,1999,A273-275:106. |
[5] | Matsunaga T;Kajiwara S;Ogawa K .[J].Materials Science and Engineering,1999,A273-275:745. |
[6] | Yaakoubi;Serre C;Martinez S et al.[J].Journal of Materials Science,2001,12:323. |
[7] | Yongqing Fu.[J].Surface and Coatings Technology,2001:107. |
[8] | 王力衡;黄运添;郑海涛.薄膜技术[M].北京:清华大学出版社,1991:53. |
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