用激光脉冲沉积技术(PLD),以N型(100)Si为基底在300℃下制备100nm非晶STO薄膜,分别用常规退火(CFA),快速退火(RTA)以及激光诱导晶化(LIC)处理将其转化多晶薄膜,用XRD测定薄膜相组分和结晶质量,用AFM观测薄膜表面微结构.比较不同工艺退火对薄膜结晶品质的影响并阐述了各自形核结晶的机理.
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