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以SmCl3·6H2O和Na2S2O3·5H2O为原料,采用电沉积法在ITO玻璃基板制备了SmS光学薄膜.采用XRD、AFM和紫外可见光分光光度计对薄膜进行了表征.研究了沉积电压和热处理温度对于薄膜的物相组成、显微结构和光学性能的影响.结果表明:在n(S):n(Sm)=4:1,溶液pH值为3.0,沉积电压为10 V以及热处理温度为400℃的条件下,可制备出主晶相为SmS且表面比较平整的薄膜.热处理后薄膜的禁带宽度增加.随着沉积电压的增加,SmS逐渐由金属相向半导体相转变,薄膜的禁带宽度相应地变大.

参考文献

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