依据原子力显微镜(AFM)微颗粒探针克服了AFM普通探针的诸多局限性及其对测试环境无要求,且能定量测定微颗粒探针与膜及污染物间的相互作用力及其变化等特点,在AFM微颗粒探针制备技术的发展及其在分离膜中的应用研究动向的基础上,详细讨论了AFM微颗粒探针的制备方法及其在膜的有机物污染研究中的具体应用,提出了AFM微颗粒探针在分离膜的有机物污染机制解析中亟待研究的问题,为科学地分析分离膜有机物污染机制及分离膜的工程设计与运行提供新的思路和途径.
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