利用XRD和振动样品磁强计研究了Gd5SixSn4-x(x=2.4、2.6、2.8)合金的结构与磁热性能.结果表明,在x=2.8时合金具有Gd5Si4形正交结构,x=2.4和2.6时则为Gd5Si4和Gd5Si2Gi2型两种结构,此外均存在少量其它杂相.随着Si含量的增大,居里温度分别为276、290.5和301.5K,逐渐升高,1.8T外加磁场变化时的磁熵变分别为1.88、2.26和1.69J/(kg·K),x=2.6时最大.低温XRD分析表明合金发生磁相变的同时没有结构相变发生.
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