运用X射线衍射(XRD)和X射线光电子能谱(XPS)对垂直布里奇曼法生长的ZnGeP2晶体的轴向组成进行分析,发现晶体的成分不均匀.采用Rietveld全谱拟合精修定量分析各物相的相对含量,发现晶体轴向组成分布存在较大差异.晶体肩部和尾部含有Ge和Zn3P2杂相,而主体部分为单相ZnGeP2质量相对较高.傅里叶变换红外光谱(FTIR)的测试结果表明,晶体轴向成分的差异对其红外透过率有较大影响.经过适当的热处理工艺,可以提高晶体的均匀性,改善其光学性能.
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