针对电子器件的高效冷却问题,对自然循环回路系统内表面加工有方柱形微结构的硅片上FC-72的强化沸腾换热性能进行了实验研究.测试了两个芯片,其表面上的方柱形微结构的边长均为30μm,但高度分别为60 μm和200 μm.沸腾介质的过冷度设为10 K、25 K和35 K.随着壁面过热度的增加,微结构表面芯片上的热流密度急剧增加且临界热流密度时芯片的表面温度低于芯片回路正常工作的临界上限温度85℃,这与其在池沸腾换热中的特点一样.但临界热流密度值与池沸腾情况相比有所降低.
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