Cr2AlC is a recently developed layered ternary carbide. In this work, the atomic scale microstructure is reported. The layer stacking sequence of Cr and Al atoms has been clearly resolved. The atomic scale characterizations were realized by means of high resolution transmission electron microscopy and Z-contrast scanning transmission electron microscopy. Furthermore, electron energy loss spectroscopic analysis revealed that the Cr-C bonds in Cr2AlC are characterized by a strong sigma bonding. (c) 2006 American Institute of Physics.
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