采用扫描电子显微镜(SEM)、能谱仪(EDS)和微拉伸实验,研究Cu/Sn-3.0Ag-0.5Cu/Cu对接焊点在不同电迁移时间下阳极、阴极界面金属间化合物(IMC)的生长演变规律及焊点抗拉强度的变化,同时对互连焊点的断口形貌及断裂模式进行分析.结果表明:在电流密度(J)为1.78×104 A/cm2、温度为373 K的加载条件下,随着加载时间的延长,焊点界面IMC的生长呈现明显的极性效应,阳极界面IMC增厚,阴极界面IMC减薄,且阳极界面IMC的生长符合抛物线规律;同时,互连焊点的抗拉强度不断下降,焊点的断裂模式由塑性断裂逐渐向脆性断裂转变,断裂位置由焊点中心向阴极界面处转移.
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