在X射线衍射结果的基础上,采用极图法研究了AIN薄膜以(DO2)和(100)面的取向分布,发现在一定条件下制备的AIN(002)有很强的织构,并通过极图法来确定X射线衍射所无法确定的AIN(100)面择优取向薄膜中各晶粒c轴间的关系.
Based on the X-ray diffraction results, the textures of aluminium nitride films were investigated by using the pole-figure method. Aluminium nitride thin films prepared have a high (002) plane texture, and most of the c-axis of particles are parallel with the normal of the substrate. Aluminium nitride thin films with (100) orientation are necessary, as they are applied to surface acoustic wave devices, and the pole-figure results are very useful for determining the c-axis of particles direction in the A1N (100) thin films.
参考文献
[1] | Liufu D, Kao K C. J. Vac. Sci. Technol. A, 1998, 16 (4): 2360--2366. [2] Marc-Alexandre Dubois, Paul Muralt. Appl. Phys. Lett., 1999, 74 (20): 3032--3034. [3] Wauk M T, Winslow D K. Appl. Phys. Lett., 1968, 13: 286--288. [4] Davis R F. Proc IEEE, 1991, 79 (5): 702--712. [5] Rodriguez-Clemente R, Aspar B, Azema N, et al. J Cryst. Growth, 1993, 133: 59--70. [6] Yang D, Jonnalagadda R, Rogers B R. Thin Solid Films, 1998, 332: 312--318. [7] Penza M, Riccardis M F D, Mirenghi L, et al. Thin Solid Films, 1993, 259: 154--159. [8] Ishihara M, Yumoto H, Tsuchiya T, et al. Thin Solid Films, 1996, 281-282: 321--326. [9] Kaya K, Takahashi H, Shibata Y, et al. Jpn. J. Appl. Phys., 1997, 36: 2837--2842. [10] Kaya K, Kanno Y, Takahashi H, et al. Jpn. J. Appl. Phys., 1996, 35: 2782--2787. [11] Xu Xiao-Hong, Wu Hai-Shun, Jin Zhi-Hao. Thin Solid Films, 2001, 388: 62--67. [12] 许小红, 张富强, 武海顺, 等(XU Xiao-Hong, et al). 无机材料学报(Journal of Inorganic Materials), 2001, 11 (6): 1161--1168. [13] 曲新喜, 杨帮朝, 姜节俭, 等. 电子薄膜材料, 北京, 科学出版社, 1997. 279--316. [14] 毛卫民, 张新明. 晶体材料织构定量分析, 北京: 冶金工业出版社, 1993. 1--17. |
上一张
下一张
上一张
下一张
计量
- 下载量()
- 访问量()
文章评分
- 您的评分:
-
10%
-
20%
-
30%
-
40%
-
50%