介绍了X射线荧光光谱在人工晶体材料组成分析中的应用.虽然x射线荧光光谱分析是一种非常有效的元素分析手段,但必须针对不同的样品和分析要求采用合适的样品制备方法,选择或配制合适的校正标样对基体效应进行校正.在样品为单晶时异常反射对光谱的定性解释和定量分析的条件选择可能产生影响,此时最好使用熔融制样法.使用测量结果时,应该充分考虑其不确定度.
The applications of X-ray fluorescence spectrometry in elemental analysis of crystals were
reviewed. Although it is an effective and efficient approach for elemental analysis, X-ray fluorescence analyses require different sample preparation
methods depending on different sample types and require calibration standards to correct matrix effects. Abnormal reflection may lead to
complicated background and confused qualitative interpretation or/and quantitative measuring conditions if the measured specimen is a single
crystal. In this case, the fusion method is preferable. Attention must be paid to the uncertainty of the measurement when the results are employed
to a specific purpose.
参考文献
| [1] | Pelikanova M. Fresenius’ Z. Anal. Chem., 1985, 320 (4): 338--340. [2] Alvarez M. X-Ray Spectrom., 1990, 19 (4): 203--206. [3] Cai S L, Guo Y L, Li J. X-Ray Spectrom., 1992, 21 (1): 17--20. [4] Malyutina T M, Sharova N A, Makarova R F, et al. Zh. Anal. Khim., 1983, 38 (12): 2137--2142. [5] Kvaratskheli Y K, Kornienko I V. Zavod. Lab., 1992, 58 (12): 17--20. [6] Bertin E U. Principles and Practice of X-Ray Spectrometric Analysis, Plenum Press New York-London, 1975. 425. [7] Malmqvist J, Tegman R. Analytical Communications, 1997, 34 (11): 343--350. [8] Lupton D F, Merker J, Scholz F. X-Ray Spectrom. 1997, 26 (3): 132--140. [9] 刘尚华, 陶光仪, 吉昂(LIU Shang-Hua, et al). 无机材料?学报(Journal of Inorganic Materials), 1999, 14 (6): 1005--1010. [10] Tertian R, Claisse F. Principles of Quantitative X-Ray Fluorescence Analysis, Heyden, London, 1982. 294--303. [11] Eksperiandova L P, Blank A B, Makarovskaya Y N. X-Ray Spectrom., 1999, 28 (1): 24--26. [12] 吉昂, 袁宁儿, 陶光仪. 分析化学, 1981, 9 (5): 580--582. [13] 卓尚军, 陶光仪, 殷之文, 等. 理化检验(化学分册), 1999, 35 (10): 435--436. [14] 卓尚军, 陶光仪, 吉~~昂. 光谱实验室, 1997, 14 (3): 15--18. [15] Bhat C K, Bhat C L, Lal M, et al. X-Ray Spectrom., 1994, 23 (6): 247--250. [16] Shevtsov N I, Blank A B, Mirenskaya I I. Zh. Anal. Khim., 1983, 38 (12): 2259--2261. [17] Jurczyk J, Sitko R, Buhl F. Chemia Analityczna (Warsaw), 1998, 43 (2): 185--195. [18] Jurczyk J, Sitko R, Buhl F, et al. Chemia Analityczna (Warsaw), 1999, 44 (2): 167--186. [19] Jurczyk J, Sitko R, Zawisza B. Chemia Analityczna (Warsaw), 2000, 45 (3): 415--428. [20] Jurczyk J, Buhl F, Wilczek I. Chemia Analityczna (Warsaw), 1993, 38 (4): 519--526. [21] Mirenskaya I I, Shevtsov N I, Blank A B, et al. Zh. Anal. Khim., 1994, 49 (5): 522--524. [22] Jenkins R, De Vries J L. Practical X-ray Spectrometry, Plenum Press New York, 1969. 49. [23] Baryshev V B, Chkalo N I, Kondratyev V I, et al. Nucl. Instrum. Methods Phys Res., 1995, A359 (1): 310--311. [24] International Standards Organization. Guide to the Expression of Uncertainty in Measurement, 1995. |
- 下载量()
- 访问量()
- 您的评分：
-
10%
-
20%
-
30%
-
40%
-
50%