采用反应射频磁控溅射技术在(0001)蓝宝石基片上制备了不同调制结构的(GDC/YSZ)12多层氧离子导体电解质薄膜.利用电子探针微区分析技术测得薄膜的摩尔质量比为m(Zr):m(Y)=5.73:1、m(Ce):m(Gd)=4.12:1;X射线衍射(XRD)与小角X射线反射(XRR)结果表明,GDC/YSZ调制比为5:1、2:1和1:2的样品(A1~A3)具有好的超晶格结构,而A4样品未形成超晶格结构;原子力显微镜形貌分析结果表明多层膜呈密集岛状生长形貌,与GDC、YSZ单层膜比较,多层膜生长岛尺寸减小,密度增大,表面粗糙度明显减小;电学性能测试与理论分析结果表明,界面缺陷使多层膜电导率提高,而GDC成分增多,则超晶格多层膜电导率增大.
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