本文采用提拉法生长了Nd:GGG晶体,并对晶体缺陷进行了系统分析,对晶体组分过冷分析结果发现,组分过冷在晶体中产生了空洞,对空洞中的物质进行了扫描电镜及能谱分析,发现组分过冷产生了第二相,用化学侵蚀法显示侵蚀坑的形貌基本呈三角形,并且位错产生了滑移现象,滑移原因是晶体切片时的外力造成的.
参考文献
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