在不同喷铸温度下制备了Zr55Al10Ni5Cu30块体非晶试样,利用电阻率法研究熔体温度对非晶结构弛豫的影响.结果表明,缺陷散射对电阻率的影响高于电子声子散射的影响；低温结构弛豫时,在1300℃时制备的试样保温前后电阻率的差值出现负值；高温结构弛豫后,随着制备非晶时熔体温度的升高,保温前后电阻率的差值逐渐减小.
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