基于含时Ginzburg-Landau（TDGL）方程建立二维超导薄膜经历快速冷却后的拓扑缺陷数目与冷却速度的关系模型.采用差分法对此模型进行了数值模拟,计算出不同冷却速度下拓扑缺陷数目随着时间的变化关系.计算结果发现,在不同冷却速度下,缺陷数目随着时间的变化可以分为两个阶段：第一阶段缺陷数目较多,拓扑缺陷数目随时间急剧减少;在第二阶段,缺陷数目较少,缺陷数目缓慢减少.而且发现,较快的冷却速度有利于形成更多的拓扑缺陷.这种变化趋势与文献[8]报道的实验结果相一致.
A model was build about the relation of the numbers of topological defects and cooling rate during a rapid quench in two-dimension superconducting films based on Time-Dependent Ginzburg-Landau（TDGL）.We present numerical solutions of the model by a difference approximation,and compute the numbers of topological defects changing with time during different cooling rates.The results show that the curve of the numbers of topological defects changing with time during different cooling rates can be divided into two stages.In the first stage,the numbers of topological defects are more.And the number of topology defects fall off rapidly with time.In the second stage,the numbers of topological defects fall off slowly with time.This was consistent with the experiment results reported in document [8].
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