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采用改进的溶胶-凝胶法在Pt/Ti/SiO2/Si衬底上制备了PZT50/50铁电薄膜-用X射线衍射表征了薄膜的物相,用原子力显微镜(AFM)表征薄膜的微观形貌,用RT-66A测量了薄膜的铁电特性,获得了具有优良的铁电性能的晶粒尺寸为100nm的PZT50/50铁电薄膜,在20V电压下,P,=31.83μC/Cm2.

参考文献

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[3] Zeng Jianming .Sol-Gel Preparation of Pb(Zr_0.50Ti_0.50)O_3 Ferroelectric Thin Films Using Zirconium Oxynitrate as the Zirconium Source[J].Journal of the American Ceramic Society,1999(1/3):461-464.
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