Layered ternary ceramics represent a new class of solids that combine the merits of both metals and ceramics. These unique properties are strongly related to their layered crystal structures and microstructures. The combination of atomic-resolution Z-contrast scanning transmission electron microscopy (STEM) and transmission electron microscopy (TEM), selected area electron diffraction (SAED), convergent beam electron diffraction (CBED) represents a powerful method to link microstructures of materials to macroscopic properties, allowing layered ternary ceramics to be investigated in an unprecedented detail. Microstructural information obtained using TEM is useful in understanding the formation mechanism, layered stacking characteristics, and defect structures for layered ternary ceramics down to atomic-scale level; and thus provides insight into understanding the ``Processing-Structure-Property" relationship of layered ternary ceramics. Transmission electron microscopic characterizations of layered ternary ceramics in Ti-Si-C, Ti-Al-C, Cr-Al-C, Zr-Al-C, Ta-Al-C and Ti-Al-N systems are reviewed.
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