采用水热法制备了氧化锡纳米晶,通过X射线衍射仪(XRD)和高分辨透射电镜(HRTEM)对氧化锡纳米晶样品的晶体结构、晶粒形貌进行了表征,并研究了氧化锡纳米晶生长和位错的产生机制.结果表明:在退火温度低于500 ℃时,晶粒生长依靠着周围的非晶成分而长大,纳米晶内部无晶格缺陷;退火温度高于500 ℃时,晶粒通过相互粘结的方式而长大.晶粒之间的不完全取向粘结导致了缺陷与位错的产生.
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