采用磁控溅射技术先在硅衬底上制备Ga2O3/Ti薄膜,然后在950℃时于流动的氨气中进行氨化反应制备GaN薄膜.X射线衍射(XRD)、傅立叶红外吸收光谱(FTIR)、选区电子衍射(SAED)和高分辨透射电子显微镜(HRTEM)的结果表明采用此方法得到了六方纤锌矿结构的GaN单晶纳米线.通过扫描电镜(SEM)观察发现纳米线的形貌,纳米棒的尺寸在50~150nm之间.
参考文献
[1] | Fasol G .[J].Science,1996,272:1751-1752. |
[2] | Nakamura S;Mukai T;Senoh M .[J].Applied Physics Letters,1994,64(13):1687-1689. |
[3] | Yang L;Wang C;Xue C et al.[J].Applied Sueface Science,2003,9892:1-5. |
[4] | Li JY.;Qiao ZY.;Cao YG.;He M.;Xu T.;Chen XL. .Synthesis of aligned gallium nitride nanowire quasi-arrays[J].Applied physics, A. Materials science & processing,2000(3):349-350. |
[5] | Wang J C;Zhan C Z;Li F G .[J].Applied Physics A:Materials Science & Processing,2002,A76:609-611. |
[6] | Boo JH.;Ho W.;Rohr C. .MOCVD of BN and GaN thin films on silicon: new attempt of GaN growth with BN buffer layer[J].Journal of Crystal Growth,1998(0):439-444. |
[7] | Sun Y.;Sonoda N.;Miyasato T. .Outdiffusion of the excess carbon in SiC films into Si substrate during film growth[J].Journal of Applied Physics,1998(11):6451-6453. |
[8] | Ding Ruiqin;Wang Hao .[J].Materials Chemistry and Physics,2003,77:841. |
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