欢迎登录材料期刊网

材料期刊网

高级检索

针对一种进口和国产的ITO靶材,用AES(SEM、SAM)、XPS、UPS和XRD进行了比较研究,通过研究发现两种样品的差别,为提高国产靶材的质量,提供一些改进意见.

参考文献

[1] 陈猛,裴志亮,白雪冬,黄荣芳,闻立时.ITO薄膜的XPS和AES研究[J].材料研究学报,2000(02):173-178.
[2] Schlafa R;Muratab H;Kafafi Z H .Work Function Measurement on Indium Tin Oxide Film[J].Journal of Electron Spectroscopy and Related Phenomena,2001,120:149.
[3] L. Chkoda;C. Heske .Work function of ITO substrates and band-offsets at the TPD/ITO interface determined by photoelectron spectroscopy[J].Synthetic Metals,2000(0):315-319.
[4] M M Beerbom;B Lagel;A J Cascio 1 et al.Direct Comparison of Photoemission Spectroscopy and in Sito Kelvin Probe Work Function Measurements on Indium Tin Oxide Films[J].Journal of Electron Spectroscopy and Related Phenomena,2006,152:12.
[5] Y Park;V Choong;Y Gao et al.Work Function of Indium Tin Oxide Transparent Conductor Measured by Photoelectron Spectroscopy[J].Applied Physics Letters,1996,68:2699.
[6] Bagas Pujilaksono;Uta Klement;Lars Nyborg et al.X-ray Photoelectron Spectroscopy Studies of Indium Tin Oxied Nanocrystalline Powder[J].Materials Characterization,2005,54:1.
[7] M Kwokaa;L Ottaviano;M Passacantando et al.XPS Study of the Surface Chemistry of L-CVD SnO2 Thin Films After Oxidation[J].Thin Solid Films,2005,490:36.
[8] H Enoki;T Nakayama;J Echigoya .The Electrical and Optical Properties of the ZnO-SnO2 Thin Films Prepared by RF Magnetron Sputtering[J].Physical Status Solidi,1992,A129:181.
[9] Sung-Min Kim;Kyung-Han Seo;Joon-Hyung Lee .Preparation and sintering of nanocrystalline ITO powders with different SnO_2 content[J].Journal of the European Ceramic Society,2006(1/2):73-80.
上一张 下一张
上一张 下一张
计量
  • 下载量()
  • 访问量()
文章评分
  • 您的评分:
  • 1
    0%
  • 2
    0%
  • 3
    0%
  • 4
    0%
  • 5
    0%