本文利用了一种简单的热蒸发法制备出了氧化铟锡(ITO)八面体纳米结构,借助X射线衍射分析仪、能谱分析、场发射扫描电子显微镜以及透射电子显微镜观测样品的结构形貌以及成分分析,结果显示ITO八面体纳米结构每个棱的长度在50～300 nm之间,所得到的晶体棱角分明.利用分光光谱仪观测样品的发光性能,发射中心分别处于417 nm和437 nm,并初步探索了其生长机制.
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