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采用TMCS对超临界干燥后的纳米多孔SiO2薄膜进行疏水处理,利用FTIR、SEM、椭偏仪和LCR测量仪等对薄膜的性能进行表征.研究表明:TMCS修饰后薄膜呈疏水性;薄膜的厚度有所降低,但孔隙率无明显变化;薄膜的实测介电常数值接近理论计算值,为2.0~2.3,且随时间无显著增大.

参考文献

[1] Shamiryan D;Abell L;Iacopi F et al.[J].Materials Today,2004,1:34.
[2] Sang H H;Kim J J;Park H H .[J].Journal of the American Ceramic Society,2000,83(03):533.
[3] Jung SB.;Park HH. .Control of surface residual -OH polar bonds in SiO2 aerogel film by silylation[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,2002(0):503-507.
[4] Moon H J;Hyung H P;Dong J K et al.[J].Journal of Applied Physics,1997,82(03):1299.
[5] Akira Nakajima;Kazuhito Hashimoto;Toshiya Watanabe .Recent Studies on Super-Hydrophobic Films[J].Monatshefte fur Chemie,2001(1):31-41.
[6] Yang HS;Choi SY;Hyun SH;Park HH;Hong JK .Ambient-dried low dielectric SiO2 aerogel thin film[J].Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites,1997(2/3):151-156.
[7] 姚兰芳,解德滨,肖轶群,沈军,吴广明,王珏.疏水型纳米SiO2增透薄膜的制备与性能研究[J].材料科学与工程学报,2004(04):502-504.
[8] Venkateswara Rao A;Kulkami Manish M .[J].Materials Research Bulletin,2002,37:1667.
[9] Li Xiaochun .[J].Journal of Non-Crystalline Solids,1996,204:235.
[10] Yang H S;Choi S Y;Hyun S H et al.[J].Thin Solid Films,1999,348:69.
[11] Kim JH.;Park HH.;Hyun SH.;Jung SB. .The effects of pre-aging and concentration of surface modifying agent on the microstructure and dielectric properties of SiO2 xerogel film[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,2000(0):467-472.
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